Josephson Dynamics at High Transmissions: Voltage and Current Bias Limits

We establish a direct relation between the I – V curves for highly transparent Josephson junctions in the voltage- and current-biased regimes. We demonstrate that the presence of sub-Ohmic dissipation at subgap voltages and temperatures yields the linear dependence of the average voltage on the bias current I exceeding the critical one , in contrast to the square root dependence in the Ohmic limit. Our predictions are compared with recent experimental findings.