Digital Twins Temporal Dependencies-Based on Time Series Using Multivariate Long Short-Term Memory

Digital Twins, which are virtual representations of physical systems mirroring their behavior, enable real-time monitoring, analysis, and optimization. Understanding and identifying the temporal dependencies included in the multivariate time series data that characterize the behavior of the system a...

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Veröffentlicht in:Electronics (Basel) 2023-10, Vol.12 (19), p.4187
Hauptverfasser: Isah, Abubakar, Shin, Hyeju, Oh, Seungmin, Oh, Sangwon, Aliyu, Ibrahim, Um, Tai-won, Kim, Jinsul
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Sprache:eng
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Zusammenfassung:Digital Twins, which are virtual representations of physical systems mirroring their behavior, enable real-time monitoring, analysis, and optimization. Understanding and identifying the temporal dependencies included in the multivariate time series data that characterize the behavior of the system are crucial for improving the effectiveness of Digital Twins. Long Short-Term Memory (LSTM) networks have been used to represent complex temporal dependencies and identify long-term links in the Industrial Internet of Things (IIoT). This paper proposed a Digital Twin temporal dependency technique using LSTM to capture the long-term dependencies in IIoT time series data, estimate the lag between the input and intended output, and handle missing data. Autocorrelation analysis showed the lagged links between variables, aiding in the discovery of temporal dependencies. The system evaluated the LSTM model by providing it with a set of previous observations and asking it to forecast the value at future time steps. We conducted a comparison between our model and six baseline models, utilizing both the Smart Water Treatment (SWaT) and Building Automation Transaction (BATADAL) datasets. Our model’s effectiveness in capturing temporal dependencies was assessed through the analysis of the Autocorrelation Function (ACF) and Partial Autocorrelation Function (PACF). The results of our experiments demonstrate that our enhanced model achieved a better long-term prediction performance.
ISSN:2079-9292
2079-9292
DOI:10.3390/electronics12194187