The temperature–frequency dependence of conductive random RC networks modelling heterogeneous/composite materials
The purpose of this study was to investigate the temperature’s effect on the dielectric response of 2D random RC networks (RRCNs) modelling heterogeneous/composite materials. We presented a comparative analysis for the conductivity behaviour using the modified effective medium approximation (EMA) an...
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Veröffentlicht in: | The European physical journal. B, Condensed matter physics Condensed matter physics, 2023-09, Vol.96 (9), Article 122 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
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Zusammenfassung: | The purpose of this study was to investigate the temperature’s effect on the dielectric response of 2D random RC networks (RRCNs) modelling heterogeneous/composite materials. We presented a comparative analysis for the conductivity behaviour using the modified effective medium approximation (EMA) and Franck and Lobb (FL) algorithm. We showed that the Summerfield frequency, the characteristic frequency
ω
c
of the conductivity and the loss frequency
ω
max
, all followed an Arrhenius dependence; they could be used as scaling frequencies. Using the loss frequency
ω
max
for different temperatures, we could represent each dielectric property in a master curve form. This latter exhibited a behaviour related to the time–temperature superposition principle (TTSP). We showed that the DC conductivity and
ω
max
exhibited the Barton–Nakajima–Namikawa (BNN) relationship
σ
dc
′
=
a
Δ
ε
′
ω
max
for which
a
∼
1
as found in the literature, where
Δ
ε
′
is the dielectric loss strength. In addition, we showed that for capacitors’ proportion
p
=
0.40
, random RC networks preserved their universal power-law (UPL) behaviour when the temperature was considered with a slight difference in the exponent value differing from the capacitors proportion. We found that the normalized conductivity and complex permittivity both scaled as
σ
′
/
σ
dc
∝
(
ω
/
ω
max
)
n
and
ε
/
ε
s
∝
(
ω
/
ω
max
)
n
-
1
, respectively, reflecting the universal dielectric response (UDR).
Graphical abstract |
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ISSN: | 1434-6028 1434-6036 |
DOI: | 10.1140/epjb/s10051-023-00588-x |