Weighted test pattern generator (TPG) for built-in self-test (BIST)

A pseudorandom test pattern is generated by a test pattern generator where a pseudo-random pattern is probably weighted to increase an fault coverage in a test that is a built-in self-test. Reduced power consumption and area can be got enabling a scan chain for the efficient weighted pattern. The weighted patterns are used for all scan chains.to build in self-test architecture. It improves the fault coverage and removes the fault at a specified output. To achieve this, a built-in self-test requirement should be focused on the highest fault coverage. The initial seed flipping is a technique is used to test coverage and test time. The proposed weighted test pattern generator simulation outputs are performed by using the Xilinx IC design suite 14.7 version IC design software.