Measurement of the Thermal Conductivity of Carbon Nanowalls by the 3ω Method

Carbon nanowall films with different thicknesses have been obtained by chemical deposition from a gas phase in a dc discharge. The thermal conductivity of the resulting structures has been measured for the first time using the 3ω method in the temperature range of 280–310 K. It has been shown that t...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:JETP letters 2023-03, Vol.117 (6), p.449-455
Hauptverfasser: Chernodubov, D. A., Bondareva, Yu. V., Shibalov, M. V., Mumlyakov, A. M., Zhdanov, V. L., Tarkhov, M. A., Maslakov, K. I., Suetin, N. V., Kvashnin, D. G., Evlashin, S. A.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Carbon nanowall films with different thicknesses have been obtained by chemical deposition from a gas phase in a dc discharge. The thermal conductivity of the resulting structures has been measured for the first time using the 3ω method in the temperature range of 280–310 K. It has been shown that the thermal conductivity of walls depends on their thickness. The thermal conductivity of 1-μm carbon nanowalls is 6.9 W m –1 K –1 . The results obtained in this work are necessary to design electro-optical devices based on carbon nanowalls.
ISSN:0021-3640
1090-6487
DOI:10.1134/S0021364023600313