Manipulation of two dimensional atom microscopy by weak probe absorption spectrum

A four-level atomic configuration, driven by the probe and standing wave control fields is used for significant modification and high resolution of atom microscopy. Five to single, stepwise atom localization peaks have been investigated at different parameters and directions of the driving standing wave fields. The atom microscopy peaks are shifted from one quadrant to the other with the variation of directions and phase tunability of the standing wave driving fields. Significant localization is investigated with precise position, high resolution and probability measurement within a wavelength domain along the x and y planes. The theoretical investigation shows potential applications in nano-lithography and atom trapping.