Formation and characterization of NiO and NiO:Al thin films prepared by chemical spray pyrolysis CSP

NiO and NiO: Al films were fabricated employing chemical spray pyrolysis (CSP) technique. XRD indicate a polycrystalline structure and dominant direction at (012), the grain size raised from 11. 55 nm to 13. 14 nm as (Al) content increment, whereas the dislocation density (δ) parameter decreases fro...

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Hauptverfasser:	Ahmed, Firdous Shaker, Mubarak, Tahseen H., Chiad, Sami Salman, Abass, Khalid Haneen, Habubi, Nadir Fadhil, Abood, Ziad M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Aluminum Dislocation density Doping Energy gap Grain size Nickel oxides Optical properties Parameters Spray pyrolysis Surface roughness Thin films Transmittance
Online-Zugang:	Volltext
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