Simulating the effect of Nitrogen application on Wheat Yield by linking remotely sensed measurements with wtgrows simulation model

A field experiment was conducted on wheat at New Delhi with five treatments of Nitrogen (N) fertilizer application (0, 30, 60, 90 and 120 kgha-1). Relationship has been established between observed leaf area index (LAI) and remotely sensed vegetation indices. These relationships are inverted and use...

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Veröffentlicht in:Journal of the Indian Society of Remote Sensing 2005-06, Vol.33 (2), p.297-305
Hauptverfasser: Sehgal, V. K., Sastri, C. V. S.
Format: Artikel
Sprache:eng
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Zusammenfassung:A field experiment was conducted on wheat at New Delhi with five treatments of Nitrogen (N) fertilizer application (0, 30, 60, 90 and 120 kgha-1). Relationship has been established between observed leaf area index (LAI) and remotely sensed vegetation indices. These relationships are inverted and used for predicting LAI from vegetation indices on different days after sowing. The “re-initialization” strategy is implemented in model WTGROWS in which initial conditions of model are changed so that the model simulated LAI match remote sensing predicted LAI. The model performance with re-initialization has been evaluated by comparing the simulated grain yield and total above-ground dry matter (TDM) values with the actual observations. The results show that in-season re-initialization is effective in model course correction by improving the simulated results of yield and TDM for different N treatments even though the model was run with no N stress condition. Model re-initialization at different days shows that the closer is the day of re-initialization to crop anthesis the more effective is model course correction. Also, the treatment showing maximum error in yield simulation without re-initialization shows maximum reduction in error by re-initialization. The approach shows that the remote sensing inputs can substitute for some of the inputs or errors in inputs required by crop models for yield prediction.
ISSN:0255-660X
0974-3006
DOI:10.1007/BF02990049