Deflected Beam Method for Absolute Current Density Determination

We present a broadly applicable in situ method for profiling ion beams using electrostatic deflectors and a Faraday cup. By deconvolving the detector geometry from the resulting current profiles, spatially resolved absolute current density profiles are obtained. We demonstrate this method's eff...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:arXiv.org 2023-03
Hauptverfasser: Mattish, Richard H, Burke, Timothy J, Johnson, Patrick R, Sosolik, Chad E, Marler, Joan P
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:We present a broadly applicable in situ method for profiling ion beams using electrostatic deflectors and a Faraday cup. By deconvolving the detector geometry from the resulting current profiles, spatially resolved absolute current density profiles are obtained. We demonstrate this method's efficacy with low-density highly charged ion beams (specifically, Ne\(^{8+}\)). Details on experimental design are provided as well as the link to the deconvolution routine on Github.
ISSN:2331-8422