Structural changes induced by electric currents in a single crystal of Pr\(_2\)CuO\(_4\)

We demonstrate a novel approach to the structural and electronic property modification of perovskites, focusing on Pr\(_2\)CuO\(_4\), an undoped parent compound of a class of electron-doped copper-oxide superconductors. Currents were passed parallel or perpendicular to the copper-oxygen layers with...

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Veröffentlicht in:arXiv.org 2023-09
Hauptverfasser: Roy, Susmita, Ye, Feng, Morgan, Zachary, Jalali, Syed I A, Zhang, Yu, Cao, Gang, Kaneko, Nobu-Hisa, Greven, Martin, Rishi Raj, Reznik, Dmitry
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Sprache:eng
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Zusammenfassung:We demonstrate a novel approach to the structural and electronic property modification of perovskites, focusing on Pr\(_2\)CuO\(_4\), an undoped parent compound of a class of electron-doped copper-oxide superconductors. Currents were passed parallel or perpendicular to the copper-oxygen layers with the voltage ramped up until a rapid drop in the resistivity was achieved, a process referred to as "flash". The current was then further increased tenfold in current-control mode. This state was quenched by immersion into liquid nitrogen. Flash can drive many compounds into different atomic structures with new properties, whereas the quench freezes them into a long-lived state. Single-crystal neutron diffraction of as-grown and modified Pr\(_2\)CuO\(_4\) revealed a \(\sqrt{10}\)x\(\sqrt{10}\) superlattice due to oxygen-vacancy order. The diffraction peak intensities of the superlattice of the modified sample were significantly enhanced relative to the pristine sample. Raman-active phonons in the modified sample were considerably sharper. Measurements of electrical resistivity, magnetization and two-magnon Raman scattering indicate that the modification affected only the Pr-O layers, but not the Cu-O planes. These results point to enhanced oxygen-vacancy order in the modified samples well beyond what can be achieved without passing electrical current. Our work opens a new avenue toward electric field/quench control of structure and properties of layered perovskite oxides.
ISSN:2331-8422