Spectral tracking of proton beams by the Timepix3 detector with GaAs, CdTe and Si sensors

Position and directional-sensitive spectrometry of energetic charged particles can be performed with high resolution and wide dynamic range (energy, direction) with the hybrid semiconductor pixel detectors Timepix/Timepix3. The choice of semiconductor sensor material, thickness, and properties such...

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Veröffentlicht in:Journal of instrumentation 2023-01, Vol.18 (1), p.C01022
Hauptverfasser: Novak, A., Granja, C., Sagatova, A., Zach, V., Stursa, J., Oancea, C.
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Sprache:eng
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Zusammenfassung:Position and directional-sensitive spectrometry of energetic charged particles can be performed with high resolution and wide dynamic range (energy, direction) with the hybrid semiconductor pixel detectors Timepix/Timepix3. The choice of semiconductor sensor material, thickness, and properties such as the reverse bias voltage, greatly determine detector sensitivity and resolving power for spectrometry and particle tracking. We investigated and evaluated the spectral tracking resolving power such as deposited energy and linear-energy-transfer (LET) spectra with the Timepix3 detector with different semiconductor sensors, based on GaAs:Cr, CdTe, and Si, using well-defined radiation sources in terms of radiation type (protons), energy, and incident direction to the detector sensor. Measurements of particle incident direction in a wide range were performed with collimated monoenergetic proton beams of various energies in the range 8–31 MeV at the U120-M cyclotron at the NPI CAS Rez near Prague. All detectors were per-pixel calibrated. This work enables to examine and perform a detailed study of charge sharing and charge collection efficiency in semiconductor sensors. The results serve to optimise the detector chip-sensor assembly configuration for measurements especially with high-LET particles in ion radiotherapy and outer space. The work underway includes evaluation of newly refined semi-insulating GaAs sensors and improved radiation hard semiconductor sensors SiC.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/18/01/C01022