Onymous early‐life performance degradation analysis of recent photovoltaic module technologies

The cost of photovoltaic (PV) modules has declined by 85% since 2010. To achieve this reduction, manufacturers altered module designs and bill of materials; changes that could affect module durability and reliability. To determine if these changes have affected module durability, we measured the per...

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Veröffentlicht in:Progress in photovoltaics 2023-02, Vol.31 (2), p.149-160
Hauptverfasser: Theristis, Marios, Stein, Joshua S., Deline, Chris, Jordan, Dirk, Robinson, Charles, Sekulic, William, Anderberg, Allan, Colvin, Dylan J., Walters, Joseph, Seigneur, Hubert, King, Bruce H.
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Sprache:eng
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Zusammenfassung:The cost of photovoltaic (PV) modules has declined by 85% since 2010. To achieve this reduction, manufacturers altered module designs and bill of materials; changes that could affect module durability and reliability. To determine if these changes have affected module durability, we measured the performance degradation of 834 fielded PV modules representing 13 module types from 7 manufacturers in 3 climates over 5 years. Degradation rates (Rd) are highly nonlinear over time, and seasonal variations are present in some module types. Mean and median degradation rate values of −0.62%/year and −0.58%/year, respectively, are consistent with rates measured for older modules. Of the 23 systems studied, 6 have degradation rates that will exceed the warranty limits in the future, whereas 13 systems demonstrate the potential of achieving lifetimes beyond 30 years, assuming Rd trends have stabilized. The cost of PV modules has declined sharply in the last decade, whereas designs and materials have also changed. Is the degradation rate for newer PV modules different than current assumptions? We measured the performance degradation of 834 fielded PV modules representing 13 module types from 7 manufacturers in 3 climates over 5 years and found a mean and median degradation rate of −0.6%/year, which is consistent with rates estimated for older modules.
ISSN:1062-7995
1099-159X
DOI:10.1002/pip.3615