Ellipsometric Analysis of Low-Dimensional Materials for Optoelectronic and Photonic Applications

— In recent years, research on atomically thin van der Waals layered crystals has become a central topic in condensed matter physics. The investigation of their optical properties is a very active area of research. It has an important presence in the development of new photonic components, optical devices, and the enhancement of existing functionalities. In this research work, we present an experimental analysis of the optical properties of three prospective examples of layered systems by spectroscopic ellipsometry. The obtained results are of great importance for the development of photo-responsive devices in the visible range, as well as for potential applications in optoelectronics and nanotechnologies.