Laser-Electric Way of Controlling Defects in High Voltage Dielectric Elements

The authors propose a way of visualizing and measuring residual partial charges accumulated on defects in dielectric high-voltage equipment during its operation. The procedure is based on the Pockels effect and uses scanning by sharply focused laser beams. The effect the electric fields of partial discharges accumulated earlier on defects have on the rate of high-voltage insulator aging is established.