Synthesis and structural characterization of nano-layers prepared from Al-Ni-Cr alloy for reflectance coatings

In this study, Al-Ni-Cr nano-layers with various thicknesses (1-layer (90 nm), 1-layer (25 nm), 2-layers (40 nm), 3-layers (65 nm)),Thickness measurement methods used in this work by the weighting method and the optical interferometer method by Lambda LIMF-10 device , and prepared by thermal evaporation technique on glass substrates under pressure of 10-7 mbar. It was observed through the results that the structure was amorphous (from XRD test) and surface of the films were a uniform, homogeneous structure, soft, and no pin holes and crakes (from SEM and AFM tests). The optical properties of the Al-Ni-Cr thin films were mainly studied by recording transmittance spectra using a visible spectrophotometer (uv) in the range of (200-1100) nm. Of these spectra, with increasing thickness the transmittance decreases while the reflectivity of nanofilms examine using 635 nm and 532 nm laser wavelength. The reflectance reached to 98% for t1 and t2 for 635 nm and 99% for the wavelength of 532 nm.