Experimental Analysis of the Effect of Shape of Shock Current Pulses on the Thermal State of a Semiconductor Device

The effect of shape of shock current pulses on the thermal state of a semiconductor device has been experimentally analyzed. The technological process of changing the parameters of a device under the action of disturbing factors has been described. Based on the heat-balance equation, the analytical...

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Veröffentlicht in:	Russian electrical engineering 2022, Vol.93 (7), p.431-434
Hauptverfasser:	Atanov, I. V., Khorol’skii, V. Ya, Gabrielyan, Sh. Zh, Zhdanov, V. G.
Format:	Artikel
Sprache:	eng
Schlagworte:	Current pulses Engineering Machines Manufacturing Mathematical analysis Process parameters Processes Semiconductor devices Shape effects
Online-Zugang:	Volltext
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