Physical investigations on Ni doping ZnO thin films along with ethanol response

Undoped and Ni-doped ZnO thin films were grown on glass substrates at 460 °C using the spray pyrolysis method. All samples were characterized by means of certain physical techniques. First, X-ray diffraction analysis revealed that undoped ZnO as well as Ni-doped ZnO thin films crystallized in the hexagonal wurtzite structure. Second, the optical bandgap value seems depending on Ni content and the optical transmittance coefficient was determined to be more than 90%. Finally, the effect of Ni doping on ethanol sensing response was also investigated. An improvement in response is obtained for ZnO:25%Ni sample.