Effect of Reflection Asymmetry on the Output of the Parametric X-Ray Radiation of Electrons in Crystals

— Using an X-ray plate as a two-dimensional position-sensitive detector, the angular distributions of parametric X-ray radiation of electrons with an energy of 255 MeV in a thin silicon crystal are measured in the asymmetric Laue geometry for the reflection planes (111) and The ratio of the measured...

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Veröffentlicht in:Surface investigation, x-ray, synchrotron and neutron techniques x-ray, synchrotron and neutron techniques, 2022-04, Vol.16 (2), p.273-280
Hauptverfasser: Berdnichenko, A. V., Vnukov, I. E., Goponov, Y. A., Shatokhin, R. A., Takabayashi, Y.
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Sprache:eng
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Zusammenfassung:— Using an X-ray plate as a two-dimensional position-sensitive detector, the angular distributions of parametric X-ray radiation of electrons with an energy of 255 MeV in a thin silicon crystal are measured in the asymmetric Laue geometry for the reflection planes (111) and The ratio of the measured radiation intensities for these reflection planes is in good agreement with calculations within the framework of the kinematic theory of parametric X-ray radiation if the contribution of the diffraction of photons excited by mechanisms of bremsstrahlung and transition radiation and the influence of the effect of reflection asymmetry on this process are taken into account.
ISSN:1027-4510
1819-7094
DOI:10.1134/S1027451022030053