Performance Improvement for Ge FinFET CMOS Inverter With Supercritical Fluid Treatment

Performance improvement on Ge nFinFET, pFinFET and CMOS inverter can be achieved by using a novel low temperature damage-free supercritical phase fluid (SCF) treatment. Thanks to effective reduction of unstable oxidation states, oxygen vacancies and interface traps, higher on-off current ratios ( {8...

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Veröffentlicht in:IEEE electron device letters 2022-06, Vol.43 (6), p.838-841
Hauptverfasser: Ruan, Dun-Bao, Chang-Liao, Kuei-Shu, Liu, Chih-Wei, Lee, Yao-Jen, Chien, Yu-Hsuan, Kuo, Bo-Lien, Chiu, Yu-Chuan, Gan, Kai-Jhih, Hsu, Chih-Chieh, Liu, Po-Tsun
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Sprache:eng
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Zusammenfassung:Performance improvement on Ge nFinFET, pFinFET and CMOS inverter can be achieved by using a novel low temperature damage-free supercritical phase fluid (SCF) treatment. Thanks to effective reduction of unstable oxidation states, oxygen vacancies and interface traps, higher on-off current ratios ( {8}\times {10}^{{5}} for pFinFET and {3.3}\times {10}^{{5}} for nFinFET), lower S.S. (72 mV/dec), higher on current (>45% improvement) and better reliability in Ge FinFETs are achieved with a SCF treatment as compared with a remote plasma post-oxidation (PPO) one. Besides, a higher voltage gain (88 V/V) of Ge FinFET CMOS inverter is obtained with a SCF treatment in comparison with a remote PPO one.
ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2022.3167952