Full-Wave Methodology to Compute the Spontaneous Emission Rate of a Transmon Qubit

The spontaneous emission rate (SER) is an important figure of merit for any quantum bit (qubit), as it can play a significant role in the control and decoherence of the qubit. As a result, accurately characterizing the SER for practical devices is an important step in the design of quantum informati...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE journal on multiscale and multiphysics computational techniques 2022, Vol.7, p.92-101
Hauptverfasser: Roth, Thomas E., Chew, Weng C.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The spontaneous emission rate (SER) is an important figure of merit for any quantum bit (qubit), as it can play a significant role in the control and decoherence of the qubit. As a result, accurately characterizing the SER for practical devices is an important step in the design of quantum information processing devices. Here, we specifically focus on the experimentally popular platform of a transmon qubit, which is a kind of superconducting circuit qubit. Despite the importance of understanding the SER of these qubits, it is often determined using approximate circuit models or is inferred from measurements on a fabricated device. To improve the accuracy of predictions in the design process, it is better to use full-wave numerical methods that can make a minimal number of approximations in the description of practical systems. In this work, we show how this can be done with a recently developed field-based description of transmon qubits coupled to an electromagnetic environment. We validate our model by computing the SER for devices similar to those found in the literature that have been well-characterized experimentally. We further cross-validate our results by comparing them to simplified lumped element circuit and transmission line models as appropriate.
ISSN:2379-8815
2379-8815
DOI:10.1109/JMMCT.2022.3169460