The Oscura Experiment

The Oscura experiment will lead the search for low-mass dark matter particles using a very large array of novel silicon Charge Coupled Devices (CCDs) with a threshold of two electrons and with a total exposure of 30 kg-yr. The R&D effort, which began in FY20, is currently entering the design pha...

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Veröffentlicht in:arXiv.org 2022-02
Hauptverfasser: Aguilar-Arevalo, Alexis, Fabricio Alcalde Bessia, Avalos, Nicolas, Baxter, Daniel, Bertou, Xavier, Bonifazi, Carla, Botti, Ana, Cababie, Mariano, Cancelo, Gustavo, Brenda Aurea Cervantes-Vergara, Castello-Mor, Nuria, Chavarria, Alvaro, Chavez, Claudio R, Chierchie, Fernando, De Egea, Juan Manuel, Juan Carlos D`Olivo, Dreyer, Cyrus E, Drlica-Wagner, Alex, Essig, Rouven, Estrada, Juan, Estrada, Ezequiel, Etzion, Erez, Fernandez-Moroni, Guillermo, Fernandez-Serra, Marivi, Holland, Steve, Agustin Lantero Barreda, Lathrop, Andrew, Lipovetzky, Jose, Loer, Ben, Edgar Marrufo Villalpando, Molina, Jorge, Perez, Santiago, Privitera, Paolo, Rodrigues, Dario, Saldanha, Richard, Diego Santa Cruz, Singal, Aman, Saffold, Nathan, Stefanazzi, Leandro, Sofo-Haro, Miguel, Tiffenberg, Javier, Torres, Christian, Uemura, Sho, Vilar, Rocio
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Sprache:eng
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Zusammenfassung:The Oscura experiment will lead the search for low-mass dark matter particles using a very large array of novel silicon Charge Coupled Devices (CCDs) with a threshold of two electrons and with a total exposure of 30 kg-yr. The R&D effort, which began in FY20, is currently entering the design phase with the goal of being ready to start construction in late 2024. Oscura will have unprecedented sensitivity to sub-GeV dark matter particles that interact with electrons, probing dark matter-electron scattering for masses down to 500 keV and dark matter being absorbed by electrons for masses down to 1 eV. The Oscura R&D effort has made some significant progress on the main technical challenges of the experiment, of which the most significant are engaging new foundries for the fabrication of the CCD sensors, developing a cold readout solution, and understanding the experimental backgrounds.
ISSN:2331-8422