Photoreflectance Spectroscopy of Porous Silicon Photonic Crystals

Photoreflectance Spectroscopy of Porous Silicon Photonic Crystals

We study one-dimensional porous silicon photonic crystals by photoreflectance (PR) spectroscopy. We calculate the reflectance and PR spectra by transfer matrix method and obtain good agreement with experimental data. We investigate the dependence of the intensity of the PR spectra on the modulating...

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Veröffentlicht in:Journal of Russian laser research 2021-11, Vol.42 (6), p.739-745
Hauptverfasser: Avakyants, Lev P., Svyakhovskiy, Sergey E., Burmistrov, Evgeny R.
Format: Artikel
Sprache:eng
Schlagworte:
Lasers
Matrix methods
Microwaves
Nonlinearity
Optical Devices
Optics
Photonic crystals
Photonics
Physics
Physics and Astronomy
Porous silicon
RF and Optical Engineering
Spectrum analysis
Temperature effects
Transfer matrices
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Zusammenfassung:We study one-dimensional porous silicon photonic crystals by photoreflectance (PR) spectroscopy. We calculate the reflectance and PR spectra by transfer matrix method and obtain good agreement with experimental data. We investigate the dependence of the intensity of the PR spectra on the modulating radiation power and measure the nonlinear refraction coefficient of porous silicon. We show that the nonlinearity is due to thermal effect.
ISSN:1071-2836
1573-8760
DOI:10.1007/s10946-021-10016-z