Mapping Non-Crystalline Nanostructure in Beam Sensitive Systems With Low-dose Scanning Electron Pair Distribution Function Analysis
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| Veröffentlicht in: | Microscopy and microanalysis 2019-08, Vol.25 (S2), p.1636-1637 |
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| container_issue | S2 |
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| container_title | Microscopy and microanalysis |
| container_volume | 25 |
| creator | Laulainen, Joonatan E. M. Johnstone, Duncan N. Bogachev, Ivan Collins, Sean M. Longley, Louis Bennett, Thomas D. Midgley, Paul A. |
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| doi_str_mv | 10.1017/S1431927619008912 |
| format | Article |
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| identifier | ISSN: 1431-9276 |
| ispartof | Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.1636-1637 |
| issn | 1431-9276 1435-8115 |
| language | eng |
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| source | Cambridge Journals |
| subjects | Distribution functions Function analysis Physical Science Symposia Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions |
| title | Mapping Non-Crystalline Nanostructure in Beam Sensitive Systems With Low-dose Scanning Electron Pair Distribution Function Analysis |
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