High resolution micrograph synthesis using a parametric texture model and a particle filter
We present a methodology for synthesizing high resolution micrographs from low resolution ones using a parametric texture model and a particle filter. Information contained in high resolution micrographs is relevant to the accurate prediction of microstructural behavior and the nucleation of instabi...
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Veröffentlicht in: | Integrating materials and manufacturing innovation 2013-12, Vol.2 (1), p.36-53 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We present a methodology for synthesizing high resolution micrographs from low resolution ones using a parametric texture model and a particle filter. Information contained in high resolution micrographs is relevant to the accurate prediction of microstructural behavior and the nucleation of instabilities. As these micrographs may be tedious and uneconomical to obtain over an extended spatial domain, we propose a statistical approach for interpolating fine details over a whole computational domain starting with a low resolution prior and high resolution micrographs available only at a few spatial locations. As a first step, a small set of high resolution micrographs are decomposed into a set of multi-scale and multi-orientation subbands using a complex wavelet transform. Parameters of a texture model are computed as the joint statistics of the decomposed subbands. The synthesis algorithm then generates random micrographs satisfying the parameters of the texture model by recursively updating the gray level values of the pixels in the input micrograph. A density-based Monte Carlo filter is used at each step of the recursion to update the generated micrograph, using a low resolution micrograph at that location as a measurement. The process is continued until the synthesized micrograph has the same statistics as those from the high resolution micrographs. The proposed method combines a texture synthesis procedure with a particle filter and produces good quality high resolution micrographs. |
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ISSN: | 2193-9764 2193-9772 |
DOI: | 10.1186/2193-9772-2-2 |