A design for testability technique for mixed-signal differential circuits

In this paper a new DFT scheme is proposed suitable for testing mixed signal differential circuits. The proposed testing-scheme is capable of detecting single catastrophic faults injected into the circuit under test. These faults can be either shorts and opens or bridgings between non contiguous nodes of the circuit. The test result is provided by a digital fail/pass indication signal. Exhaustive simulations have revealed the effectiveness of the proposed technique in terms of fault coverage and cost.