Highly charged ion beam diagnostics at the mVINIS Ion Source

In order to determine position, dimensions and intensities of multiply charged ion beams at the mVINIS Ion Source, a novel method was developed based on a fluorescent screen and a commercial digital TV camera. The spatial characteristics of multiply charged ion beams (for example the ionization stat...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of physics. Conference series 2007-03, Vol.58 (1), p.423-426
Hauptverfasser: Popeskov, B, Milivojevic, M, Cvetic, J, Nedeljkovic, T, Draganic, I
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In order to determine position, dimensions and intensities of multiply charged ion beams at the mVINIS Ion Source, a novel method was developed based on a fluorescent screen and a commercial digital TV camera. The spatial characteristics of multiply charged ion beams (for example the ionization states of Ar2+ to Ar10+) have been precisely measured and analyzed at the TESLA Accelerator Installation for the first time. In this work, we discuss in details the characteristics of Ar8+ion beams. The obtained ion beam characteristics were compared with the results of previously applied conventional methods of ion beam diagnostics.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/58/1/097