Nanostructure analysis by coherent hard X-ray diffraction

Nanostructure analysis by coherent hard X-ray diffraction

We report our recent activities on x-ray diffraction microscopy. We have been developing hardware and software instruments for efficient recording of high-quality coherent diffraction data. By using the microscope system developed, we carried out coherent diffraction measurement for various samples...

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Veröffentlicht in:Journal of physics. Conference series 2009-09, Vol.186 (1), p.012056
Hauptverfasser: Nishino, Yoshinori, Takahashi, Yukio, Kubo, Hideto, Furukawa, Hayato, Yamauchi, Kazuto, Maeshima, Kazuhiro, Imamoto, Naoko, Hirohata, Ryuta, Matsubara, Eiichiro, Ishikawa, Tetsuya
Format: Artikel
Sprache:eng
Schlagworte:
Coherence
Materials science
Physics
X-ray diffraction
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Beschreibung
Zusammenfassung:We report our recent activities on x-ray diffraction microscopy. We have been developing hardware and software instruments for efficient recording of high-quality coherent diffraction data. By using the microscope system developed, we carried out coherent diffraction measurement for various samples in materials science and biology, and succeeded in three-dimensional reconstruction revealing the internal structure.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/186/1/012056