Auger-electron spectroscopy investigation of thin Ag-As-S-Se films

Auger-electron spectroscopy investigation of thin Ag-As-S-Se films

The photoinduced changes in the refractive index and optical band-gap of thin As32S34Se34 films photodoped with silver were studied using spectrophotometric methods. The compositional profile of the films was revealed by means of Auger-electron spectroscopy.

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Veröffentlicht in:Journal of physics. Conference series 2010-04, Vol.223 (1), p.012040
Hauptverfasser: Todorov, R, Tasseva, J, Spasov, G, Petkov, K
Format: Artikel
Sprache:eng
Schlagworte:
Auger spectroscopy
Electron spectroscopy
Physics
Refractivity
Silver
Spectrophotometry
Spectrum analysis
Thin films
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Zusammenfassung:The photoinduced changes in the refractive index and optical band-gap of thin As32S34Se34 films photodoped with silver were studied using spectrophotometric methods. The compositional profile of the films was revealed by means of Auger-electron spectroscopy.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/223/1/012040