Lattice distortions in GaN thin films on (0001) sapphire
The GaN/sapphire microstructure and lattice distortions in GaN were investigated using convergent beam electron diffraction (CBED) and electron backscatter diffraction (EBSD). CBED studies showed small scale (
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Veröffentlicht in: | Journal of physics. Conference series 2010-02, Vol.209 (1), p.012022 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The GaN/sapphire microstructure and lattice distortions in GaN were investigated using convergent beam electron diffraction (CBED) and electron backscatter diffraction (EBSD). CBED studies showed small scale ( |
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ISSN: | 1742-6596 1742-6588 1742-6596 |
DOI: | 10.1088/1742-6596/209/1/012022 |