Transverse-type Lattice Modulation in LaO0.5F0.5BiS2: Possible Charge Density Wave Formation

We report a synchrotron radiation X-ray diffraction study of the BiS2-layered superconductor LaO0.5F0.5BiS2. We observed superlattice reflections with the propagation vector qlat=(ζ,ζ,0.500(1)) (ζ = 0.2075(1) at 30 K) below T* ≈ 260 K. The reflection conditions indicate that the superlattice structu...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of the Physical Society of Japan 2021-10, Vol.90 (10), p.1
Hauptverfasser: Kajitani, Joe, Sagayama, Ryoko, Sagayama, Hajime, Matsuura, Keisuke, Hasegawa, Takumi, Kumai, Reiji, Murakami, Youichi, Mita, Masaaki, Asano, Takuya, Higashinaka, Ryuji, Matsuda, Tatsuma D, Aoki, Yuji
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:We report a synchrotron radiation X-ray diffraction study of the BiS2-layered superconductor LaO0.5F0.5BiS2. We observed superlattice reflections with the propagation vector qlat=(ζ,ζ,0.500(1)) (ζ = 0.2075(1) at 30 K) below T* ≈ 260 K. The reflection conditions indicate that the superlattice structure corresponds to in-plane transverse-type modulation. This finding along with the results of bond valence sum analysis suggests charge density wave formation with qcdw = 2qlat induced by Peierls-type instability.
ISSN:0031-9015
1347-4073
DOI:10.7566/JPSJ.90.103601