On the Possibility of Generating a Shock Current Pulse for Testing Power Semiconductor Devices Using an AC Power Grid
In this paper, we show that it is possible to use an ac grid to obtain high-magnitude electrical current pulses used in testing power semiconductor devices. Disadvantages of current capacitor-based test setups are noted. A design solution for partitioning the transformer secondary winding by splitti...
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| Veröffentlicht in: | Russian electrical engineering 2021-07, Vol.92 (7), p.401-403 |
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| container_end_page | 403 |
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| container_issue | 7 |
| container_start_page | 401 |
| container_title | Russian electrical engineering |
| container_volume | 92 |
| creator | Shemyakin, V. N. Mastepanenko, M. A. Khorolsky, V. Ya Efanov, A. V. Vorotnikov, I. N. |
| description | In this paper, we show that it is possible to use an ac grid to obtain high-magnitude electrical current pulses used in testing power semiconductor devices. Disadvantages of current capacitor-based test setups are noted. A design solution for partitioning the transformer secondary winding by splitting its multiwire execution into separate bundles is proposed. |
| doi_str_mv | 10.3103/S1068371221070099 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2575081567</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2575081567</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1839-6f94e855307eaf42b47e097aeaf7ff2f55ec60e7633c38c873f0da3f1b5ee30d3</originalsourceid><addsrcrecordid>eNp1kF9LwzAUxYsoOKcfwLeAz9Wbpmnax1F1CoMNtj2XLr3ZMrdkJq2yb2_2B3wQn24u53fODSeK7ik8MgrsaUohy5mgSUJBABTFRdSjBUvjHChchneQ44N-Hd14vwbgWZKmvagbG9KukEys93qhN7rdE6vIEA26utVmSWoyXVn5QcrOOTQtmXQbj0RZR2boj8TEfqMjU9xqaU3TyTZoz_ilJXoy98cMQwblmRs63dxGV6oOMXfn2Y_mry-z8i0ejYfv5WAUS5qzIs5UkWLOOQOBtUqTRSoQClGHRSiVKM5RZoAiY0yyXOaCKWhqpuiCIzJoWD96OOXunP3swnerte2cCSerhAsOOeWZCBQ9UdKFFhyqauf0tnb7ikJ1aLf6027wJCePD6xZovtN_t_0A6ANe8c</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2575081567</pqid></control><display><type>article</type><title>On the Possibility of Generating a Shock Current Pulse for Testing Power Semiconductor Devices Using an AC Power Grid</title><source>SpringerLink Journals (MCLS)</source><creator>Shemyakin, V. N. ; Mastepanenko, M. A. ; Khorolsky, V. Ya ; Efanov, A. V. ; Vorotnikov, I. N.</creator><creatorcontrib>Shemyakin, V. N. ; Mastepanenko, M. A. ; Khorolsky, V. Ya ; Efanov, A. V. ; Vorotnikov, I. N.</creatorcontrib><description>In this paper, we show that it is possible to use an ac grid to obtain high-magnitude electrical current pulses used in testing power semiconductor devices. Disadvantages of current capacitor-based test setups are noted. A design solution for partitioning the transformer secondary winding by splitting its multiwire execution into separate bundles is proposed.</description><identifier>ISSN: 1068-3712</identifier><identifier>EISSN: 1934-8010</identifier><identifier>DOI: 10.3103/S1068371221070099</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>Alternating current ; Current pulses ; Electric power grids ; Engineering ; Machines ; Manufacturing ; Power semiconductor devices ; Processes</subject><ispartof>Russian electrical engineering, 2021-07, Vol.92 (7), p.401-403</ispartof><rights>Allerton Press, Inc. 2021. ISSN 1068-3712, Russian Electrical Engineering, 2021, Vol. 92, No. 7, pp. 401–403. © Allerton Press, Inc., 2021. Russian Text © The Author(s), 2021, published in Elektrotekhnika, 2021, No. 7, pp. 54–57.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.3103/S1068371221070099$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.3103/S1068371221070099$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Shemyakin, V. N.</creatorcontrib><creatorcontrib>Mastepanenko, M. A.</creatorcontrib><creatorcontrib>Khorolsky, V. Ya</creatorcontrib><creatorcontrib>Efanov, A. V.</creatorcontrib><creatorcontrib>Vorotnikov, I. N.</creatorcontrib><title>On the Possibility of Generating a Shock Current Pulse for Testing Power Semiconductor Devices Using an AC Power Grid</title><title>Russian electrical engineering</title><addtitle>Russ. Electr. Engin</addtitle><description>In this paper, we show that it is possible to use an ac grid to obtain high-magnitude electrical current pulses used in testing power semiconductor devices. Disadvantages of current capacitor-based test setups are noted. A design solution for partitioning the transformer secondary winding by splitting its multiwire execution into separate bundles is proposed.</description><subject>Alternating current</subject><subject>Current pulses</subject><subject>Electric power grids</subject><subject>Engineering</subject><subject>Machines</subject><subject>Manufacturing</subject><subject>Power semiconductor devices</subject><subject>Processes</subject><issn>1068-3712</issn><issn>1934-8010</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNp1kF9LwzAUxYsoOKcfwLeAz9Wbpmnax1F1CoMNtj2XLr3ZMrdkJq2yb2_2B3wQn24u53fODSeK7ik8MgrsaUohy5mgSUJBABTFRdSjBUvjHChchneQ44N-Hd14vwbgWZKmvagbG9KukEys93qhN7rdE6vIEA26utVmSWoyXVn5QcrOOTQtmXQbj0RZR2boj8TEfqMjU9xqaU3TyTZoz_ilJXoy98cMQwblmRs63dxGV6oOMXfn2Y_mry-z8i0ejYfv5WAUS5qzIs5UkWLOOQOBtUqTRSoQClGHRSiVKM5RZoAiY0yyXOaCKWhqpuiCIzJoWD96OOXunP3swnerte2cCSerhAsOOeWZCBQ9UdKFFhyqauf0tnb7ikJ1aLf6027wJCePD6xZovtN_t_0A6ANe8c</recordid><startdate>20210701</startdate><enddate>20210701</enddate><creator>Shemyakin, V. N.</creator><creator>Mastepanenko, M. A.</creator><creator>Khorolsky, V. Ya</creator><creator>Efanov, A. V.</creator><creator>Vorotnikov, I. N.</creator><general>Pleiades Publishing</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20210701</creationdate><title>On the Possibility of Generating a Shock Current Pulse for Testing Power Semiconductor Devices Using an AC Power Grid</title><author>Shemyakin, V. N. ; Mastepanenko, M. A. ; Khorolsky, V. Ya ; Efanov, A. V. ; Vorotnikov, I. N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1839-6f94e855307eaf42b47e097aeaf7ff2f55ec60e7633c38c873f0da3f1b5ee30d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Alternating current</topic><topic>Current pulses</topic><topic>Electric power grids</topic><topic>Engineering</topic><topic>Machines</topic><topic>Manufacturing</topic><topic>Power semiconductor devices</topic><topic>Processes</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shemyakin, V. N.</creatorcontrib><creatorcontrib>Mastepanenko, M. A.</creatorcontrib><creatorcontrib>Khorolsky, V. Ya</creatorcontrib><creatorcontrib>Efanov, A. V.</creatorcontrib><creatorcontrib>Vorotnikov, I. N.</creatorcontrib><collection>CrossRef</collection><jtitle>Russian electrical engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shemyakin, V. N.</au><au>Mastepanenko, M. A.</au><au>Khorolsky, V. Ya</au><au>Efanov, A. V.</au><au>Vorotnikov, I. N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>On the Possibility of Generating a Shock Current Pulse for Testing Power Semiconductor Devices Using an AC Power Grid</atitle><jtitle>Russian electrical engineering</jtitle><stitle>Russ. Electr. Engin</stitle><date>2021-07-01</date><risdate>2021</risdate><volume>92</volume><issue>7</issue><spage>401</spage><epage>403</epage><pages>401-403</pages><issn>1068-3712</issn><eissn>1934-8010</eissn><abstract>In this paper, we show that it is possible to use an ac grid to obtain high-magnitude electrical current pulses used in testing power semiconductor devices. Disadvantages of current capacitor-based test setups are noted. A design solution for partitioning the transformer secondary winding by splitting its multiwire execution into separate bundles is proposed.</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.3103/S1068371221070099</doi><tpages>3</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1068-3712 |
| ispartof | Russian electrical engineering, 2021-07, Vol.92 (7), p.401-403 |
| issn | 1068-3712 1934-8010 |
| language | eng |
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| source | SpringerLink Journals (MCLS) |
| subjects | Alternating current Current pulses Electric power grids Engineering Machines Manufacturing Power semiconductor devices Processes |
| title | On the Possibility of Generating a Shock Current Pulse for Testing Power Semiconductor Devices Using an AC Power Grid |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T05%3A55%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=On%20the%20Possibility%20of%20Generating%20a%20Shock%20Current%20Pulse%20for%20Testing%20Power%20Semiconductor%20Devices%20Using%20an%20AC%20Power%20Grid&rft.jtitle=Russian%20electrical%20engineering&rft.au=Shemyakin,%20V.%20N.&rft.date=2021-07-01&rft.volume=92&rft.issue=7&rft.spage=401&rft.epage=403&rft.pages=401-403&rft.issn=1068-3712&rft.eissn=1934-8010&rft_id=info:doi/10.3103/S1068371221070099&rft_dat=%3Cproquest_cross%3E2575081567%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2575081567&rft_id=info:pmid/&rfr_iscdi=true |