On the Possibility of Generating a Shock Current Pulse for Testing Power Semiconductor Devices Using an AC Power Grid

On the Possibility of Generating a Shock Current Pulse for Testing Power Semiconductor Devices Using an AC Power Grid

In this paper, we show that it is possible to use an ac grid to obtain high-magnitude electrical current pulses used in testing power semiconductor devices. Disadvantages of current capacitor-based test setups are noted. A design solution for partitioning the transformer secondary winding by splitti...

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Veröffentlicht in:Russian electrical engineering 2021-07, Vol.92 (7), p.401-403
Hauptverfasser: Shemyakin, V. N., Mastepanenko, M. A., Khorolsky, V. Ya, Efanov, A. V., Vorotnikov, I. N.
Format: Artikel
Sprache:eng
Schlagworte:
Alternating current
Current pulses
Electric power grids
Engineering
Machines
Manufacturing
Power semiconductor devices
Processes
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Zusammenfassung:In this paper, we show that it is possible to use an ac grid to obtain high-magnitude electrical current pulses used in testing power semiconductor devices. Disadvantages of current capacitor-based test setups are noted. A design solution for partitioning the transformer secondary winding by splitting its multiwire execution into separate bundles is proposed.
ISSN:1068-3712
1934-8010
DOI:10.3103/S1068371221070099