Interaction of electromagnetic H-wave with thin conducting film taking into account anisotropy of isoenergetic surface of conductor

The coefficients of reflection, absorption and transmission of electromagnetic H-wave with thin conducting film located between two dielectric environments are calculated in the framework of the kinetic theory in this article. The case of an anisotropic isoenergetic surface of a conductor is conside...

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Veröffentlicht in:Journal of physics. Conference series 2020-06, Vol.1560 (1), p.12010
Hauptverfasser: Kuznetsova, I A, Romanov, D N, Yushkanov, A A
Format: Artikel
Sprache:eng
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Zusammenfassung:The coefficients of reflection, absorption and transmission of electromagnetic H-wave with thin conducting film located between two dielectric environments are calculated in the framework of the kinetic theory in this article. The case of an anisotropic isoenergetic surface of a conductor is considered. The electromagnetic wave is incident onto the upper surface of the film at an arbitrary angle. The case of different specularity coefficients when reflecting electrons (holes) from the lower and upper surfaces of the film is considered. The isoenergetic surface of the conductor is a three-axis ellipsoid, one main axis of which is parallel to the normal to the boundary of the film, and the other to the electric field of the incident electromagnetic wave. The analysis of the dependences of the reflection, absorption and transmission coefficients on the effective mass for degenerate and non-degenerate gas of free charge carriers is carried out.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/1560/1/012010