Effect of an Antimony Sublayer on the Structure and Galvanomagnetic Properties of Thin Bismuth–Antimony Films (3 and 5 at % Sb) on Mica Substrates

We study the influence of an antimony sublayer (10 nm) on the structure and galvanomagnetic properties of bismuth–antimony films with an antimony content of 3 and 5 at %, up to 1-µm thick, obtained by discrete vacuum evaporation, as well as films recrystallized by the zone-melting method. When using an antimony sublayer, blocks with a significant deviation of the trigonal axis from the normal to the film surface are revealed. The area of such blocks increases with increasing antimony concentration. In recrystallized films, when using a sublayer, the orientation of the trigonal axis is maintained perpendicular to the film plane and adhesion to the substrate is improved. Single-crystal films with an antimony sublayer are of interest for studying the possibilities of deformation engineering for modifying the band structure of thin, highly perfect films of bismuth–antimony solid solution in order to get the desired properties.