Comparative study of the structural properties to the molecular beam epitaxial growth of the Fe/Ag and Fe/Cr/Ag thin films

Fe/Ag and Fe/Cr/Ag thin films grown on MgO (001) single-crystal substrate by molecular beam epitaxy are compared on the basis of their structural properties. The low and high X-ray diffraction measurements have suggested the same dependences of the interface roughness to the thickness of the buffer...

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Veröffentlicht in:	IOP conference series. Materials Science and Engineering 2010-01, Vol.13 (1), p.012013-4
Hauptverfasser:	Boukhalfa, R, Chemam, F, Boubellou, A
Format:	Artikel
Sprache:	eng
Schlagworte:	Buffer layers Chromium Comparative studies Diffraction Epitaxial growth Interface roughness Iron Magnesium oxide Molecular beam epitaxy Silver Single crystals Substrates Surface roughness Thickness Thin films
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