Comparative study of the structural properties to the molecular beam epitaxial growth of the Fe/Ag and Fe/Cr/Ag thin films

Comparative study of the structural properties to the molecular beam epitaxial growth of the Fe/Ag and Fe/Cr/Ag thin films

Fe/Ag and Fe/Cr/Ag thin films grown on MgO (001) single-crystal substrate by molecular beam epitaxy are compared on the basis of their structural properties. The low and high X-ray diffraction measurements have suggested the same dependences of the interface roughness to the thickness of the buffer...

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Veröffentlicht in:IOP conference series. Materials Science and Engineering 2010-01, Vol.13 (1), p.012013-4
Hauptverfasser: Boukhalfa, R, Chemam, F, Boubellou, A
Format: Artikel
Sprache:eng
Schlagworte:
Buffer layers
Chromium
Comparative studies
Diffraction
Epitaxial growth
Interface roughness
Iron
Magnesium oxide
Molecular beam epitaxy
Silver
Single crystals
Substrates
Surface roughness
Thickness
Thin films
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Zusammenfassung:Fe/Ag and Fe/Cr/Ag thin films grown on MgO (001) single-crystal substrate by molecular beam epitaxy are compared on the basis of their structural properties. The low and high X-ray diffraction measurements have suggested the same dependences of the interface roughness to the thickness of the buffer layer of silver in both kinds of the samples (sample I without Cr seed layer and sample II with Cr layers). However, the surface roughness of sample I was completely reduced by the introduction of the Cr layer in sample II, which was characterized by smooth and well-formed interfaces
ISSN:1757-899X
1757-8981
1757-899X
DOI:10.1088/1757-899X/13/1/012013