Comparative study of the structural properties to the molecular beam epitaxial growth of the Fe/Ag and Fe/Cr/Ag thin films
Fe/Ag and Fe/Cr/Ag thin films grown on MgO (001) single-crystal substrate by molecular beam epitaxy are compared on the basis of their structural properties. The low and high X-ray diffraction measurements have suggested the same dependences of the interface roughness to the thickness of the buffer...
Gespeichert in:
| Veröffentlicht in: | IOP conference series. Materials Science and Engineering 2010-01, Vol.13 (1), p.012013-4 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 4 |
|---|---|
| container_issue | 1 |
| container_start_page | 012013 |
| container_title | IOP conference series. Materials Science and Engineering |
| container_volume | 13 |
| creator | Boukhalfa, R Chemam, F Boubellou, A |
| description | Fe/Ag and Fe/Cr/Ag thin films grown on MgO (001) single-crystal substrate by molecular beam epitaxy are compared on the basis of their structural properties. The low and high X-ray diffraction measurements have suggested the same dependences of the interface roughness to the thickness of the buffer layer of silver in both kinds of the samples (sample I without Cr seed layer and sample II with Cr layers). However, the surface roughness of sample I was completely reduced by the introduction of the Cr layer in sample II, which was characterized by smooth and well-formed interfaces |
| doi_str_mv | 10.1088/1757-899X/13/1/012013 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_O3W</sourceid><recordid>TN_cdi_proquest_journals_2564754877</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2564754877</sourcerecordid><originalsourceid>FETCH-LOGICAL-c340t-4ba0f2e9cb13c0da8b1a961e52a7811b0d729bc475942fb457495d223878e4293</originalsourceid><addsrcrecordid>eNp9kU1LxDAQhosouK7-BCHgxYO1SZpumuNSXBUWvCh4C2mb7mZpm5qk6vrrTa1fyOIpM5PnnUneCYJTBC8RTNMI0YSGKWOPEYojFEGEIYr3gsl3ff9XfBgcWbuBcEYJgZPgLdNNJ4xw6lkC6_pyC3QF3HpITF-43ogadEZ30jglLXD647LRtSz6WhiQS9EA2SknXpVHV0a_uPVXj4WM5isg2nKIMjMkbq1aUKm6scfBQSVqK08-z2nwsLi6z27C5d31bTZfhkVMoAtJLmCFJStyFBewFGmOBJshmWBBU4RyWFLM8oLQhBFc5SShhCUlxnFKU0kwi6fB-djXf-Opl9bxRtlC1rVope4tRzT2dhBGiUfP_qAb3ZvWv47jZOZHkJRSTyUjVRhtrZEV74xqhNlyBPmwET64zQe3OYo54uNGvO5i1Cnd_Uh2obwrK4_DHfi_E94BgIKabA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2564754877</pqid></control><display><type>article</type><title>Comparative study of the structural properties to the molecular beam epitaxial growth of the Fe/Ag and Fe/Cr/Ag thin films</title><source>Open Access: IOP Publishing Free Content</source><creator>Boukhalfa, R ; Chemam, F ; Boubellou, A</creator><creatorcontrib>Boukhalfa, R ; Chemam, F ; Boubellou, A</creatorcontrib><description>Fe/Ag and Fe/Cr/Ag thin films grown on MgO (001) single-crystal substrate by molecular beam epitaxy are compared on the basis of their structural properties. The low and high X-ray diffraction measurements have suggested the same dependences of the interface roughness to the thickness of the buffer layer of silver in both kinds of the samples (sample I without Cr seed layer and sample II with Cr layers). However, the surface roughness of sample I was completely reduced by the introduction of the Cr layer in sample II, which was characterized by smooth and well-formed interfaces</description><identifier>ISSN: 1757-899X</identifier><identifier>ISSN: 1757-8981</identifier><identifier>EISSN: 1757-899X</identifier><identifier>DOI: 10.1088/1757-899X/13/1/012013</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Buffer layers ; Chromium ; Comparative studies ; Diffraction ; Epitaxial growth ; Interface roughness ; Iron ; Magnesium oxide ; Molecular beam epitaxy ; Silver ; Single crystals ; Substrates ; Surface roughness ; Thickness ; Thin films</subject><ispartof>IOP conference series. Materials Science and Engineering, 2010-01, Vol.13 (1), p.012013-4</ispartof><rights>Copyright IOP Publishing Nov 2010</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c340t-4ba0f2e9cb13c0da8b1a961e52a7811b0d729bc475942fb457495d223878e4293</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/1757-899X/13/1/012013/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,1547,27605,27901,27902,53879,53906</link.rule.ids><linktorsrc>$$Uhttp://iopscience.iop.org/1757-899X/13/1/012013$$EView_record_in_IOP_Publishing$$FView_record_in_$$GIOP_Publishing</linktorsrc></links><search><creatorcontrib>Boukhalfa, R</creatorcontrib><creatorcontrib>Chemam, F</creatorcontrib><creatorcontrib>Boubellou, A</creatorcontrib><title>Comparative study of the structural properties to the molecular beam epitaxial growth of the Fe/Ag and Fe/Cr/Ag thin films</title><title>IOP conference series. Materials Science and Engineering</title><description>Fe/Ag and Fe/Cr/Ag thin films grown on MgO (001) single-crystal substrate by molecular beam epitaxy are compared on the basis of their structural properties. The low and high X-ray diffraction measurements have suggested the same dependences of the interface roughness to the thickness of the buffer layer of silver in both kinds of the samples (sample I without Cr seed layer and sample II with Cr layers). However, the surface roughness of sample I was completely reduced by the introduction of the Cr layer in sample II, which was characterized by smooth and well-formed interfaces</description><subject>Buffer layers</subject><subject>Chromium</subject><subject>Comparative studies</subject><subject>Diffraction</subject><subject>Epitaxial growth</subject><subject>Interface roughness</subject><subject>Iron</subject><subject>Magnesium oxide</subject><subject>Molecular beam epitaxy</subject><subject>Silver</subject><subject>Single crystals</subject><subject>Substrates</subject><subject>Surface roughness</subject><subject>Thickness</subject><subject>Thin films</subject><issn>1757-899X</issn><issn>1757-8981</issn><issn>1757-899X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNp9kU1LxDAQhosouK7-BCHgxYO1SZpumuNSXBUWvCh4C2mb7mZpm5qk6vrrTa1fyOIpM5PnnUneCYJTBC8RTNMI0YSGKWOPEYojFEGEIYr3gsl3ff9XfBgcWbuBcEYJgZPgLdNNJ4xw6lkC6_pyC3QF3HpITF-43ogadEZ30jglLXD647LRtSz6WhiQS9EA2SknXpVHV0a_uPVXj4WM5isg2nKIMjMkbq1aUKm6scfBQSVqK08-z2nwsLi6z27C5d31bTZfhkVMoAtJLmCFJStyFBewFGmOBJshmWBBU4RyWFLM8oLQhBFc5SShhCUlxnFKU0kwi6fB-djXf-Opl9bxRtlC1rVope4tRzT2dhBGiUfP_qAb3ZvWv47jZOZHkJRSTyUjVRhtrZEV74xqhNlyBPmwET64zQe3OYo54uNGvO5i1Cnd_Uh2obwrK4_DHfi_E94BgIKabA</recordid><startdate>20100101</startdate><enddate>20100101</enddate><creator>Boukhalfa, R</creator><creator>Chemam, F</creator><creator>Boubellou, A</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M7S</scope><scope>PDBOC</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>7SR</scope><scope>7TB</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>FR3</scope><scope>JG9</scope><scope>KR7</scope><scope>L7M</scope></search><sort><creationdate>20100101</creationdate><title>Comparative study of the structural properties to the molecular beam epitaxial growth of the Fe/Ag and Fe/Cr/Ag thin films</title><author>Boukhalfa, R ; Chemam, F ; Boubellou, A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c340t-4ba0f2e9cb13c0da8b1a961e52a7811b0d729bc475942fb457495d223878e4293</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Buffer layers</topic><topic>Chromium</topic><topic>Comparative studies</topic><topic>Diffraction</topic><topic>Epitaxial growth</topic><topic>Interface roughness</topic><topic>Iron</topic><topic>Magnesium oxide</topic><topic>Molecular beam epitaxy</topic><topic>Silver</topic><topic>Single crystals</topic><topic>Substrates</topic><topic>Surface roughness</topic><topic>Thickness</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Boukhalfa, R</creatorcontrib><creatorcontrib>Chemam, F</creatorcontrib><creatorcontrib>Boubellou, A</creatorcontrib><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>ProQuest Engineering Database</collection><collection>Materials Science Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering collection</collection><collection>Engineered Materials Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IOP conference series. Materials Science and Engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Boukhalfa, R</au><au>Chemam, F</au><au>Boubellou, A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Comparative study of the structural properties to the molecular beam epitaxial growth of the Fe/Ag and Fe/Cr/Ag thin films</atitle><jtitle>IOP conference series. Materials Science and Engineering</jtitle><date>2010-01-01</date><risdate>2010</risdate><volume>13</volume><issue>1</issue><spage>012013</spage><epage>4</epage><pages>012013-4</pages><issn>1757-899X</issn><issn>1757-8981</issn><eissn>1757-899X</eissn><abstract>Fe/Ag and Fe/Cr/Ag thin films grown on MgO (001) single-crystal substrate by molecular beam epitaxy are compared on the basis of their structural properties. The low and high X-ray diffraction measurements have suggested the same dependences of the interface roughness to the thickness of the buffer layer of silver in both kinds of the samples (sample I without Cr seed layer and sample II with Cr layers). However, the surface roughness of sample I was completely reduced by the introduction of the Cr layer in sample II, which was characterized by smooth and well-formed interfaces</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1757-899X/13/1/012013</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1757-899X |
| ispartof | IOP conference series. Materials Science and Engineering, 2010-01, Vol.13 (1), p.012013-4 |
| issn | 1757-899X 1757-8981 1757-899X |
| language | eng |
| recordid | cdi_proquest_journals_2564754877 |
| source | Open Access: IOP Publishing Free Content |
| subjects | Buffer layers Chromium Comparative studies Diffraction Epitaxial growth Interface roughness Iron Magnesium oxide Molecular beam epitaxy Silver Single crystals Substrates Surface roughness Thickness Thin films |
| title | Comparative study of the structural properties to the molecular beam epitaxial growth of the Fe/Ag and Fe/Cr/Ag thin films |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T10%3A52%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_O3W&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Comparative%20study%20of%20the%20structural%20properties%20to%20the%20molecular%20beam%20epitaxial%20growth%20of%20the%20Fe/Ag%20and%20Fe/Cr/Ag%20thin%20films&rft.jtitle=IOP%20conference%20series.%20Materials%20Science%20and%20Engineering&rft.au=Boukhalfa,%20R&rft.date=2010-01-01&rft.volume=13&rft.issue=1&rft.spage=012013&rft.epage=4&rft.pages=012013-4&rft.issn=1757-899X&rft.eissn=1757-899X&rft_id=info:doi/10.1088/1757-899X/13/1/012013&rft_dat=%3Cproquest_O3W%3E2564754877%3C/proquest_O3W%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2564754877&rft_id=info:pmid/&rfr_iscdi=true |