On the Influence of the Alkaline Composition of Liquid Subphase on the Nafion Film Morphology
An X-ray reflectivity analysis has shown that the composition of liquid substrates affects the structure of deposited Nafion (Teflon copolymer) films. A model of Nafion monomer, developed based on small-angle X-ray scattering data, is used to interpret the results of X-ray reflectivity analysis.
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Veröffentlicht in: | Physics of wave phenomena 2021-04, Vol.29 (2), p.131-135 |
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Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | An X-ray reflectivity analysis has shown that the composition of liquid substrates affects the structure of deposited Nafion (Teflon copolymer) films. A model of Nafion monomer, developed based on small-angle X-ray scattering data, is used to interpret the results of X-ray reflectivity analysis. |
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ISSN: | 1541-308X 1934-807X |
DOI: | 10.3103/S1541308X21020023 |