On the Influence of the Alkaline Composition of Liquid Subphase on the Nafion Film Morphology

An X-ray reflectivity analysis has shown that the composition of liquid substrates affects the structure of deposited Nafion (Teflon copolymer) films. A model of Nafion monomer, developed based on small-angle X-ray scattering data, is used to interpret the results of X-ray reflectivity analysis.

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Veröffentlicht in:Physics of wave phenomena 2021-04, Vol.29 (2), p.131-135
Hauptverfasser: Asadchikov, V. E., Bunkin, N. F., Volkov, V. V., Volkov, Yu. O., Nuzhdin, A. D., Stepina, N. D., Roshchin, B. S., Tikhonov, A. M.
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Sprache:eng
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Zusammenfassung:An X-ray reflectivity analysis has shown that the composition of liquid substrates affects the structure of deposited Nafion (Teflon copolymer) films. A model of Nafion monomer, developed based on small-angle X-ray scattering data, is used to interpret the results of X-ray reflectivity analysis.
ISSN:1541-308X
1934-807X
DOI:10.3103/S1541308X21020023