Simulation of 2D Interference Pattern Structure for Rectangular and Circular Slits Using Dual Beam Interference Technique
Laser interference lithography (LIL) is known to be based completely on the dual‐beam interference (DBI) technique. In this present work, a 2D interference pattern structure for rectangular and circular slits is simulated. The proposed 2D pattern structure is optimized by varying the slit width and...
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Veröffentlicht in: | Macromolecular symposia. 2021-06, Vol.397 (1), p.n/a |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | Laser interference lithography (LIL) is known to be based completely on the dual‐beam interference (DBI) technique. In this present work, a 2D interference pattern structure for rectangular and circular slits is simulated. The proposed 2D pattern structure is optimized by varying the slit width and slit separation. Several fringe patterns following the varying slit width and slit separation are reported. |
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ISSN: | 1022-1360 1521-3900 |
DOI: | 10.1002/masy.202100001 |