Characterizing Energetic Dependence of Low-Energy Neutron-Induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65-nm Bulk SRAM

Characterizing Energetic Dependence of Low-Energy Neutron-Induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65-nm Bulk SRAM

Characterizing low-energy neutrons (

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on nuclear science 2021-06, Vol.68 (6), p.1228-1234
Hauptverfasser: Liao, Wang, Ito, Kojiro, Abe, Shin-ichiro, Mitsuyama, Yukio, Hashimoto, Masanori
Format: Artikel
Sprache:eng
Schlagworte:
Accelerated tests
Bars
Energy
Energy measurement
Fluctuations
Low-energy neutrons
Mathematical analysis
multiple cells upsets (MCUs)
Neutron flux
Neutrons
Nuclear cross sections
Radiation effects
Semiconductor device measurement
Single event upsets
single-event upset (SEV)
static random access memories (SRAMs)
Terrestrial environments
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Beschreibung
Zusammenfassung:Characterizing low-energy neutrons (
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2021.3077266