The implicit features of microfocus x-ray sources in the development of imaging systems

The purpose of this work is to demonstrate the features of Russian and imported microfocus X-ray devices that are not explicitly specified in the manufacturer's documentation, but have a significant impact on the characteristics of the imaging system. The paper presents the following experimental observations: the focal spot (FS) size dependence on the tube voltage and current; the non-standard shape of the FS intensity profile; the difference in the effective FS size in the visualization field for tubes with a massive anode with a known inclination angle; drift (movement) of the actual FS on the target surface depending on the parameters of the voltage and current of the tube, as well as during continuous exposure.