A Novel Dynamic Time Method for Organic Light-Emitting Diode Degradation Estimation in Display Application

This work presents a time discretization strategy to estimate the current degradation of OLED devices in circuit-level simulation. An equivalent time point method is used to calculate degradation rate appropriately under dynamic bias conditions, and temperature effect due to ambient or device self-heating during operation is also included. Groups of OLEDs with various aging conditions are measured more than 1000 hours and the current attenuation ( \Delta \text{I} ) of OLED is compared by the proposed methodology to verify the accuracy. Furthermore, the simulation results indicate our method could properly describe the current degradation and the bias voltage ( \text{V}_{OLED} ) shift in pixel circuit under pulse amplitude modulation (PAM) or pulse width modulation (PWM) driving method, which is nearly impossible to be calculated with analytic solutions.