Packaged Ga2O3 Schottky Rectifiers With Over 60-A Surge Current Capability

Ultrawide-bandgap gallium oxide (Ga 2 O 3 ) devices have recently emerged as promising candidates for power electronics; however, the low thermal conductivity ( k T ) of Ga 2 O 3 causes serious concerns about their electrothermal ruggedness. This letter presents the first experimental demonstrations...

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Veröffentlicht in:IEEE transactions on power electronics 2021-08, Vol.36 (8), p.8565-8569
Hauptverfasser: Xiao, Ming, Wang, Boyan, Liu, Jingcun, Zhang, Ruizhe, Zhang, Zichen, Ding, Chao, Lu, Shengchang, Sasaki, Kohei, Lu, Guo-Quan, Buttay, Cyril, Zhang, Yuhao
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Sprache:eng
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Zusammenfassung:Ultrawide-bandgap gallium oxide (Ga 2 O 3 ) devices have recently emerged as promising candidates for power electronics; however, the low thermal conductivity ( k T ) of Ga 2 O 3 causes serious concerns about their electrothermal ruggedness. This letter presents the first experimental demonstrations of large-area Ga 2 O 3 Schottky barrier diodes (SBDs) packaged in the bottom-side-cooling and double-side-cooling configurations, and for the first time, characterizes the surge current capabilities of these packaged Ga 2 O 3 SBDs. Contrary to popular belief, Ga 2 O 3 SBDs with proper packaging show high surge current capabilities. The double-side-cooled Ga 2 O 3 SBDs with a 3 × 3-mm 2 Schottky contact area can sustain a peak surge current over 60 A, with a ratio between the peak surge current and the rated current superior to that of similarly-rated commercial SiC SBDs. The key enabling mechanisms for this high surge current are the small temperature dependence of on -resistance, which strongly reduces the thermal runaway, and the double-side-cooled packaging, in which the heat is extracted directly from the Schottky junction and does not need to go through the low- k T bulk Ga 2 O 3 chip. These results remove some crucial concerns regarding the electrothermal ruggedness of Ga 2 O 3 power devices and manifest the significance of their die-level thermal management.
ISSN:0885-8993
1941-0107
DOI:10.1109/TPEL.2021.3049966