Process Defects and Failure Analysis Methods of Crystal Oscillator
The common failure modes of crystal oscillators are vibration stop, waveform abnormality and frequency drift, there are many failure mechanisms, some of which are related to process defects, such as chip process defects, module packaging process defects and crystal process defects. In order to disco...
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Veröffentlicht in: | Journal of physics. Conference series 2021-04, Vol.1885 (2), p.22040 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | The common failure modes of crystal oscillators are vibration stop, waveform abnormality and frequency drift, there are many failure mechanisms, some of which are related to process defects, such as chip process defects, module packaging process defects and crystal process defects. In order to discover the process defects, summarize the performance, appearance, reason and failure analysis methods of its common process defects is necessary. Introduced several common process defects of current SMD crystal oscillators and corresponding analysis methods through specific case analysis. |
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ISSN: | 1742-6588 1742-6596 |
DOI: | 10.1088/1742-6596/1885/2/022040 |