Adjoint EM Sensitivity Analysis for Fast Frequency Sweep Using Matrix Padé via Lanczos Technique Based on Finite-Element Method

Sensitivity analysis is important for electromagnetic (EM)-based design. The existing adjoint EM sensitivity analysis methods have to solve large systems of EM equations repetitively for different frequencies. This article addresses this situation and proposes to speed up the EM sensitivity analysis...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on microwave theory and techniques 2021-05, Vol.69 (5), p.2413-2428
Hauptverfasser: Feng, Feng, Zhang, Jianan, Jin, Jing, Zhang, Wei, Zhao, Zhihao, Zhang, Qi-Jun
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Sensitivity analysis is important for electromagnetic (EM)-based design. The existing adjoint EM sensitivity analysis methods have to solve large systems of EM equations repetitively for different frequencies. This article addresses this situation and proposes to speed up the EM sensitivity analysis over a frequency range by solving EM equations at only a single frequency. A new adjoint EM sensitivity analysis algorithm for the fast frequency sweep using the matrix Padé via Lanczos (MPVL) technique based on the finite-element method (FEM) is proposed in this article. MPVL is incorporated to relate the information of one frequency to the information of multiple frequencies. A large system of EM equations is then solved at a single frequency to predict the sensitivity information for the entire frequency band. Adjoint formulations are further derived to avoid the effect of the number of design variables. The adjoint EM sensitivity analysis using the proposed technique can obtain the same accuracy as the existing techniques while taking less time by avoiding repetitively solving large systems of EM equations for different frequencies and different design variables. The proposed technique is demonstrated by three EM examples of microwave components.
ISSN:0018-9480
1557-9670
DOI:10.1109/TMTT.2021.3061566