Channeling of Charged Particles Near the Surface of Semiconductors and Conducting Crystals
— The features of the orientational motion and channeling of charged particles are considered. They move in a near-surface potential well whose structure is formed by the surface plane of a crystal and by the action of the vector potential of the electric current flowing through a crystal or along a...
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Veröffentlicht in: | Surface investigation, x-ray, synchrotron and neutron techniques x-ray, synchrotron and neutron techniques, 2021-03, Vol.15 (2), p.302-308 |
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Format: | Artikel |
Sprache: | eng |
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The features of the orientational motion and channeling of charged particles are considered. They move in a near-surface potential well whose structure is formed by the surface plane of a crystal and by the action of the vector potential of the electric current flowing through a crystal or along a conductor, near which a nonconducting crystal is located. The width of the potential well forming the near-surface channeling mode depends on the crystal thickness and the electric current density and can vary in the range from several millimeters to a few micrometers as the current density varies in the range of 1–1000 A/cm
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. The process of near-surface channeling in the field of a plane conductor with current provides the abnormally weak deceleration of particles and can be used to transport particle beams along conductors with current over large distances. A similar axial channeling mode is characterized by the complete suppression of the scattering and deceleration of ion beams during their motion in free space along the surface of a cylindrical conductor with current. |
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ISSN: | 1027-4510 1819-7094 |
DOI: | 10.1134/S1027451021020178 |