Effects of incomplete ionization on forward current–voltage characteristics of p-type diamond Schottky barrier diodes based on numerical simulation

The forward current–voltage characteristics of p-type diamond pseudo-vertical Schottky barrier diodes are investigated via numerical simulation. Impact ionization decrease the hole concentration of the p− drift layer from 10 15 to 10 14  cm –3 at 300 K, thereby increasing the forward voltage drop an...

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Veröffentlicht in:Japanese Journal of Applied Physics 2021-06, Vol.60 (SC), p.SCCE08
Hauptverfasser: Seok, Ogyun, Ha, Min-Woo
Format: Artikel
Sprache:eng
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Zusammenfassung:The forward current–voltage characteristics of p-type diamond pseudo-vertical Schottky barrier diodes are investigated via numerical simulation. Impact ionization decrease the hole concentration of the p− drift layer from 10 15 to 10 14  cm –3 at 300 K, thereby increasing the forward voltage drop and on-resistance. When we consider an incomplete ionization with increasing temperature, the increase in the hole concentration is more dominant than the enhanced phonon scattering, thereby resulting in an increasing forward current. We modified the Ohmic contact for both metallic conduction at the p+ layer and incomplete ionization at the p– drift layer. The Baliga figure-of-merit of the device with and without incomplete ionization is 25 and 192 MW cm −2 , respectively. Incomplete ionization should be considered in the numerical study of diamond power devices.
ISSN:0021-4922
1347-4065
DOI:10.35848/1347-4065/abf2a7