AC conductivity and dielectric properties of 98[20Li2O-xBi2O3-(80-x)TeO2]-2Ag mixed ionic-electronic glasses
Mixed ionic-electronic 98[20Li 2 O- x Bi 2 O 3 -(80- x )TeO 2 ]-2Ag ( x = 3, 5, 7, 11, 13 and 15 mol%) glasses were prepared by melt-quenching technique to investigate their AC conductivity and dielectric properties. Structural analysis revealed the increase of non-bridging oxygen (NBO) up to x = ...
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Veröffentlicht in: | Journal of materials science. Materials in electronics 2021-02, Vol.32 (4), p.5138-5155 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Mixed ionic-electronic 98[20Li
2
O-
x
Bi
2
O
3
-(80-
x
)TeO
2
]-2Ag (
x
= 3, 5, 7, 11, 13 and 15 mol%) glasses were prepared by melt-quenching technique to investigate their AC conductivity and dielectric properties. Structural analysis revealed the increase of non-bridging oxygen (NBO) up to
x
= 5 mol% before dropping at
x
= 7 mol% followed by a further increase at
x
> 7 mol%. The nonlinear behaviour of AC conductivity with Bi
2
O
3
showed an initial increase in
σ
AC
until reaching a minimum at
x
= 7 and 11 mol% before increasing again at
x
> 11 mol%. The minimum is suggested to be due to the blocking effects of Bi
2
O
3
towards ionic conduction caused by mixed ionic-electronic (MIE) effect. Other than that, dielectric constant displayed an anomalous decrease at
x
= 7 mol% followed by a steep increase at
x
> 7 mol%. This decrease could also be related to blocking effects induced by MIE that contributes to a reduction of space charge polarization. The anomalous decrease at
x
= 7 mol% coincided with a minimum of
σ
AC
for the same glass composition. Meanwhile, another nonlinear behaviour is observed on
M
′ with a maximum at
x
= 7 and 11 mol% which coincided with the location of
σ
AC
minimum that may be due to MIE effect attributed to the blocking effect of Bi
2
O
3
to migrating ions which then led to high resistance. Electrical modulus analysis reveals the non-Debye relaxation nature for the glass samples indicating the presence of dynamic ions processes. |
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ISSN: | 0957-4522 1573-482X |
DOI: | 10.1007/s10854-021-05246-5 |