Correction to: An automated assessment method for integrated circuit chip detachment from printed circuit board by multistep binarization and template matching of X-ray transmission images

Correction to: An automated assessment method for integrated circuit chip detachment from printed circuit board by multistep binarization and template matching of X-ray transmission images

The article “An automated assessment method for integrated circuit chip detachment from printed circuit board.

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of material cycles and waste management 2021, Vol.23 (1), p.424-424
Hauptverfasser: Ueda, Takao, Oki, Tatsuya, Koyanaka, Shigeki
Format: Artikel
Sprache:eng
Schlagworte:
Automation
Civil Engineering
Correction
Engineering
Environmental Management
Integrated circuits
Printed circuit boards
Waste Management/Waste Technology
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The article “An automated assessment method for integrated circuit chip detachment from printed circuit board.
ISSN:1438-4957
1611-8227
DOI:10.1007/s10163-020-01144-w