Study on dark-field imaging with a laboratory x-ray source: Random stress variation analysis based on x-ray grating interferometry
The dark-field image (DFI) in a grating interferometer involves the small-angle scattering properties of a material. The microstructure of the material can be characterized by an analysis of the auto-correlation length and the DFI. The feasibility of a DFI in a laboratory x-ray source with grating i...
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Veröffentlicht in: | Review of scientific instruments 2021-01, Vol.92 (1), p.015103-015103 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The dark-field image (DFI) in a grating interferometer involves the small-angle scattering properties of a material. The microstructure of the material can be characterized by an analysis of the auto-correlation length and the DFI. The feasibility of a DFI in a laboratory x-ray source with grating interferometry has been reported, but a follow-up study is needed. In this study, the random stress distribution was measured in the laboratory environment as an applied study. SiO2 mono-spheres as a cohesive powder with a 0.5 µm particle size were used as the sample. The microstructural changes according to the stresses on the particles were observed by acquiring a DFI along the auto-correlation length. In x-rays, a random two-phase media model was first used to analyze the characteristics of cohesive powder. This study showed that the microstructure of materials and x-ray images could be analyzed in a laboratory environment. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/5.0011619 |